XPS
provides surface analysis of nearly any solid material, even in low concentration and ultra-thin layers measurements.
The XPS Axis Supra provides elemental and chemical information about the surface region of nearly any solid material including the chemically sensitive materials. Detection of elemental composition as a function of depth is also possible with using ion etching capabilities installed at our instrument.
The exceptionally high spectral resolution enables accurate measurement of chemical shifts.
The instrument is capable of real time photoelectron imaging of the sample surface.
Due to its charge neutralization system the Axis Supra is particularly useful for insulating materials such as polymers, oxides, and powders where charging effects limit other surface techniques.
The AXIS Supra has completely automated sample handling that provides exceptionally high analytical throughput.
Photos by Yoav Dudkevitch
Kratos | Site
Edmond J. Safra (Givat-Ram)
Nano Center
Contacts
- Inna Popov
- innap@savion.huji.ac.il