Probe Station
Possible measurements include:Four point surface resistivity, IV, CV, Pulsed IV /CV for heat sensitive samples, Transistor characterization.
A Probe Station is a versatile and precise tool used for testing and characterizing electrical properties of semiconductor devices, microelectronics, and other small-scale components. It provides a platform for making electrical connections to a device under test (DUT) by using fine probes, enabling detailed analysis and performance testing. Equipped with a microscope, temperature control, and positioning systems, a probe station allows researchers and engineers to perform tasks such as I-V curve measurements, RF testing, and failure analysis. This device is widely used in research and development, manufacturing, and quality assurance processes, particularly in the semiconductor and nanotechnology industries. Its ability to work at micro and nano scales makes it essential for the advancement of cutting-edge electronic technologies.
Lucas Labs S-302-4 , Keithley 4200 | Site
Edmond J. Safra (Givat-Ram)
Nano Center
Contacts
- Golan Tanami
- golant@savion.huji.ac.il