Optical Profilometer
Surface Topography on Nanometer Scale
An Optical Profilometer is a high-precision, non-contact instrument used to measure the surface characteristics of materials and objects. It provides detailed insights into surface topography, including roughness, height, depth, and other geometric features. This device is widely employed across industries for quality control, material research, and surface analysis. Common applications include evaluating surface roughness in electronics, inspecting microstructures in medical devices, and analyzing materials in engineering and research. Using technologies like interferometry and optical confocal methods, an optical profilometer ensures accurate, fast, and non-destructive measurements, making it ideal for studying delicate or highly reflective surfaces. Its versatility and precision make it a critical tool for both industrial and academic settings.
photos by Yoav Dudkevitch
Edmond J. Safra (Givat-Ram)
Nano Center
Contacts
- Golan Tanami
- golant@savion.huji.ac.il