HR TEM Talos F200i
The Talos F200i is an advanced scanning transmission electron microscope (STEM/TEM) for atomic-scale material characterization in nanotechnology and materials science. Operating at 200 kV with an X-CFEG cold electron source, it delivers exceptional beam stability and high-resolution imaging of crystalline structures. Key features include dual EDS detectors for rapid elemental mapping, a five-axis piezo stage for precise positioning, and a NanoEx in-situ holder for real-time observation of dynamic chemical and electrochemical processes. The Talos F200i provides a versatile platform for nanomaterials research, defect analysis, and multidisciplinary studies.
Center for Nanoscience and Nanotechnology | Site
Edmond J. Safra (Givat-Ram)
Nano Center
Contacts
- Inna Popov
- innap@savion.huji.ac.il