HR-TEM 200 KeV

The microscope combines ultra high resolution performance (point resolution 0.24 nm, line resolution 0.1 nm, limit of information 0.15 nm and HR STEM resolution <0.2 nm) with extended analytical abilities. It equipped with EDS detector (spectral resolution133 eV), Gatan Imaging Filter system allowing EELS spectroscopy (with resolution < 0.8 eV) and energy filtered imaging and High Angular Annular Dark Field Detector allowing high resolution STEM Z-contrast imaging.

Thermo Fisher Scientific | Site

Edmond J. Safra (Givat-Ram)

Nano Center