Profilometer Dektak XT
Dektak can measure large vertical features of sensitive materials (up to 1mm tall) with angstrom-level repeatability. Researchers in MEMS and microfluidics industries can rely on DektakXT for the critical measurements needed to verify their parts are built to specification. The low force measurement capability, NLite+, applies a light touch to sensitive materials to measure vertical steps and roughness accurately without damaging the sample’s surface.
Bruker | Site
Edmond J. Safra (Givat-Ram)
Nano Center
Contacts
- Golan Tanami
- golant@savion.huji.ac.il