DB FIB
Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) combines electron and ion beams (therefore it is a Dual Beam - DB), in the same instrument. The SEM column provides high resolution imaging, while the FIB column enables modification of samples.The DB technology is used in many fields of science for site-specific analysis, imaging, milling, deposition, precise TEM (Transmission Electron Microscopy) sample preparation and chemical analysis (by using an EDS detector).
Thermo Fisher Scientific | Site
Edmond J. Safra (Givat-Ram)
Nano Center