Analytical HR SEM

Analytical high resolution scanning electron microscope Apreo is a versatile tool for advanced studies in the areas of materials science, semi-conductor and the electronics industries and life-science. The microscope uses Shottky type Field Emission Source and allows wide range of accelerating voltages from 200 V to 30 kV. It is able to achieve resolutions of 1.5 nm at > 10 kV and 2.5 nm at 1 kV. The microscope has complete set of detectors providing imagining in secondary and back-scattered electrons including Through-the-Lens detector with variable bias for ultra high resolution observation. The system is optimised for operation at low kV, allowing un-coated and isolating materials to be examined with minimum charging. Sirion offers ultra-high spatial resolution both for structural research and high resolution analytical work (energy dispersive X-ray spectroscopy (EDS), cathodoluminiscence (CL), electron back-scattered diffraction (EBSD) 

Thermo Fisher Scientific | Site

Edmond J. Safra (Givat-Ram)

Nano Center