HR TEM Talos F200i
Analytical high resolution Scanning Transmission Electron Microscope
The Talos F200i microscope is an essential tool for researchers focusing on in-depth, nanoscale material characterization, particularly in nanotechnology and material science. Its advanced capabilities combine STEM and TEM imaging methods, producing high-quality images that highlight precise material structures, including crystalline structures. The device operates with a 200 kV electron beam and an innovative cold electron source (X-CFEG), offering stability and reliability for atomic-level resolution, essential for analyzing complex materials and nanotechnology components.Using its EDS system, the microscope can identify the chemical composition of materials and detect elements at the elemental level. The Dual-XFlash6 detectors, with high collection efficiency, allow fast and accurate chemical analysis and elemental mapping at nanoscale cross-sections, ideal for researchers seeking detailed material distribution. Additionally, the five-axis piezoelectric stage provides further stability and ensures precise focusing for consistent data collection, while the unique NanoEx holder supports in-situ experiments, enabling real-time analysis of chemical and electrochemical reactions.
Thermo Fisher Scientific | Site
Edmond J. Safra (Givat-Ram)
Nano Center
Contacts
- Inna Popov
- innap@savion.huji.ac.il