Cryo SEM
The microscope combines high vacuum, low vacuum and wet-mode to support a variety of material characterization applications. The instrument allows for examination of non-conducting, contaminated, hydrated and even living samples without significant sample preparation, in addition to those samples that have always been viewable under conventional scanning electron microscopes. It allows for user selection of accelerating voltage, magnification, gas type, gas pressure and detector type. This flexibility promotes cross-disciplinary research for all who utilize the ESEM.
Thermo Fisher Scientific | Site
Edmond J. Safra (Givat-Ram)
Nano Center
Contacts
- Inna Popov
- innap@savion.huji.ac.il